Texas Instruments - SN74BCT8374ANT

KEY Part #: K1320202

[6529Stock Ngahau]


    Te waahanga waahanga:
    SN74BCT8374ANT
    Kaihanga:
    Texas Instruments
    Whakaahuatanga Taipitopito:
    IC SCAN TEST DEVICE W/FF 24-DIP.
    Ko te wa kaiarahi paerewa a te kaihanga:
    I roto i te taonga
    Te whare noho:
    Kotahi Tau
    Chip Mai:
    Hong Kong
    RoHS:
    Te tikanga utu:
    Te ara kaipuke:
    Ngā Kāwai Whānau:
    KEY Components Co, Ko te LTD he Kaiwhakarite Taonga Hiko e tuku ana i nga waahanga hua tae atu ki: Karaka / Taima - Tono Tono, Whakauruhia - Microcontrollers, Pūmahara - Pūhiko, PMIC - Te Ture Whakahaere / Whakahaere Nei, Karaka / Taima - Tapahi Raina, Raina - Te Whakataurite, Pūmahara and PMIC - He Tohutoro Ngaa ...
    Whakapai Tinana:
    We specialize in Texas Instruments SN74BCT8374ANT electronic components. SN74BCT8374ANT can be shipped within 24 hours after order. If you have any demands for SN74BCT8374ANT, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8374ANT Nga Hua Hua

    Te waahanga waahanga : SN74BCT8374ANT
    Kaihanga : Texas Instruments
    Whakaahuatanga : IC SCAN TEST DEVICE W/FF 24-DIP
    Toa : 74BCT
    Wāhanga wahi : Obsolete
    Momo Waahanga : Scan Test Device with D-Type Edge-Triggered Flip-Flops
    Taonga Whakaputanga : 4.5V ~ 5.5V
    Tuhinga o mua : 8
    Taumaha Mahi : 0°C ~ 70°C
    Momo Momo : Through Hole
    Paepae / Take : 24-DIP (0.300", 7.62mm)
    Paetukutuku Pūrere Kaiwhakarato : 24-PDIP