Te waahanga waahanga :
SN74BCT8374ANTG4
Kaihanga :
Texas Instruments
Whakaahuatanga :
IC SCAN TEST DEVICE W/FF 24-DIP
Momo Waahanga :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Taonga Whakaputanga :
4.5V ~ 5.5V
Taumaha Mahi :
0°C ~ 70°C
Paepae / Take :
24-DIP (0.300", 7.62mm)
Paetukutuku Pūrere Kaiwhakarato :
24-PDIP