Texas Instruments - SN74BCT8374ANTG4

KEY Part #: K1320201

[6537Stock Ngahau]


    Te waahanga waahanga:
    SN74BCT8374ANTG4
    Kaihanga:
    Texas Instruments
    Whakaahuatanga Taipitopito:
    IC SCAN TEST DEVICE W/FF 24-DIP.
    Ko te wa kaiarahi paerewa a te kaihanga:
    I roto i te taonga
    Te whare noho:
    Kotahi Tau
    Chip Mai:
    Hong Kong
    RoHS:
    Te tikanga utu:
    Te ara kaipuke:
    Ngā Kāwai Whānau:
    KEY Components Co, Ko te LTD he Kaiwhakarite Taonga Hiko e tuku ana i nga waahanga hua tae atu ki: Atanga - Tauira - ICs me te Tohu, Whakawhiwhinga Raraunga - Analog ki te Tahuri Mama, Pokapu IC, Logic - Motuhake Motuhake, Logic - Nga Koki me nga Kaituri, PMIC - Atekōkiri, Haurua Tapahi, PMIC - Nga Kaiwhakahaere Tohutoro - Te Kaupapa Mot and PMIC - Ko te V / F me te Kaihuri F / V ...
    Whakapai Tinana:
    We specialize in Texas Instruments SN74BCT8374ANTG4 electronic components. SN74BCT8374ANTG4 can be shipped within 24 hours after order. If you have any demands for SN74BCT8374ANTG4, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8374ANTG4 Nga Hua Hua

    Te waahanga waahanga : SN74BCT8374ANTG4
    Kaihanga : Texas Instruments
    Whakaahuatanga : IC SCAN TEST DEVICE W/FF 24-DIP
    Toa : 74BCT
    Wāhanga wahi : Obsolete
    Momo Waahanga : Scan Test Device with D-Type Edge-Triggered Flip-Flops
    Taonga Whakaputanga : 4.5V ~ 5.5V
    Tuhinga o mua : 8
    Taumaha Mahi : 0°C ~ 70°C
    Momo Momo : Through Hole
    Paepae / Take : 24-DIP (0.300", 7.62mm)
    Paetukutuku Pūrere Kaiwhakarato : 24-PDIP