Texas Instruments - SN74BCT8374ADWR

KEY Part #: K1320204

[6512Stock Ngahau]


    Te waahanga waahanga:
    SN74BCT8374ADWR
    Kaihanga:
    Texas Instruments
    Whakaahuatanga Taipitopito:
    IC SCAN TEST DEVICE W/FF 24-SOIC.
    Ko te wa kaiarahi paerewa a te kaihanga:
    I roto i te taonga
    Te whare noho:
    Kotahi Tau
    Chip Mai:
    Hong Kong
    RoHS:
    Te tikanga utu:
    Te ara kaipuke:
    Ngā Kāwai Whānau:
    KEY Components Co, Ko te LTD he Kaiwhakarite Taonga Hiko e tuku ana i nga waahanga hua tae atu ki: Atanga - CODEC, Whakawhiwhinga Raraunga - Analog Front End (AFE), Raina - Whakapono Analog, Kaiwhakapara, PMIC - Atekiwa Peere, Karaka / Taima - Ko nga Patene IC, ICs motuhake, PMIC - Ko te V / F me te Kaihuri F / V and Karaka / Taima - Akona Taitara Katoa ...
    Whakapai Tinana:
    We specialize in Texas Instruments SN74BCT8374ADWR electronic components. SN74BCT8374ADWR can be shipped within 24 hours after order. If you have any demands for SN74BCT8374ADWR, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8374ADWR Nga Hua Hua

    Te waahanga waahanga : SN74BCT8374ADWR
    Kaihanga : Texas Instruments
    Whakaahuatanga : IC SCAN TEST DEVICE W/FF 24-SOIC
    Toa : 74BCT
    Wāhanga wahi : Obsolete
    Momo Waahanga : Scan Test Device with D-Type Edge-Triggered Flip-Flops
    Taonga Whakaputanga : 4.5V ~ 5.5V
    Tuhinga o mua : 8
    Taumaha Mahi : 0°C ~ 70°C
    Momo Momo : Surface Mount
    Paepae / Take : 24-SOIC (0.295", 7.50mm Width)
    Paetukutuku Pūrere Kaiwhakarato : 24-SOIC